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半導體分立器件測試解決方案

LDO芯片特性測試方案

一、概述


LDO,全稱為(wei)“Low Dropout Regulator”,是一種(zhong)低壓(ya)(ya)(ya)差(cha)線性(xing)穩壓(ya)(ya)(ya)元(yuan)(yuan)器(qi)(qi)件。其(qi)工作原理為(wei),使用在其(qi)飽和區域內運行的(de)(de)晶體管或場(chang)效應管(FET),從應用的(de)(de)輸(shu)入(ru)電(dian)(dian)(dian)壓(ya)(ya)(ya)中(zhong)減去超額(e)的(de)(de)電(dian)(dian)(dian)壓(ya)(ya)(ya),產生經(jing)過調節的(de)(de)輸(shu)出(chu)電(dian)(dian)(dian)壓(ya)(ya)(ya)。相比于傳統的(de)(de)DC-DC變換器(qi)(qi),LDO具有成本低,噪音低,靜態電(dian)(dian)(dian)流小的(de)(de)特點,需要的(de)(de)外(wai)接元(yuan)(yuan)件也很少,因此,LDO廣(guang)泛(fan)應用于需要穩壓(ya)(ya)(ya)輸(shu)出(chu)的(de)(de)場(chang)景。

20220415162804_8476.png20220415162815_0104.png



(UTC78XX系(xi)列(lie)LDO封裝以及內部電路示意圖)


4-1.png20220415163021_8272.png



(普賽斯(si)S系列源表)                              (UTC7805 LDO電參(can)數規格書(shu))



源(yuan)(yuan)(yuan)(yuan)表(biao)(biao)(biao)(biao),SMU(Source Measure Unit)電(dian)(dian)(dian)源(yuan)(yuan)(yuan)(yuan)/測(ce)量(liang)(liang)單(dan)元,“源(yuan)(yuan)(yuan)(yuan)”為電(dian)(dian)(dian)壓(ya)源(yuan)(yuan)(yuan)(yuan)和電(dian)(dian)(dian)流(liu)(liu)源(yuan)(yuan)(yuan)(yuan),“表(biao)(biao)(biao)(biao)”為測(ce)量(liang)(liang)表(biao)(biao)(biao)(biao),“源(yuan)(yuan)(yuan)(yuan)表(biao)(biao)(biao)(biao)”即指一種可(ke)(ke)作(zuo)為四(si)象限的電(dian)(dian)(dian)壓(ya)源(yuan)(yuan)(yuan)(yuan)或電(dian)(dian)(dian)流(liu)(liu)源(yuan)(yuan)(yuan)(yuan)提供(gong)精確的電(dian)(dian)(dian)壓(ya)或電(dian)(dian)(dian)流(liu)(liu),同時可(ke)(ke)同步測(ce)量(liang)(liang)電(dian)(dian)(dian)流(liu)(liu)值或電(dian)(dian)(dian)壓(ya)值的測(ce)量(liang)(liang)儀表(biao)(biao)(biao)(biao)。普賽斯S系列(lie)高精度(du)源(yuan)(yuan)(yuan)(yuan)表(biao)(biao)(biao)(biao),集電(dian)(dian)(dian)壓(ya)、電(dian)(dian)(dian)流(liu)(liu)輸(shu)(shu)入輸(shu)(shu)出及測(ce)量(liang)(liang)等多種功(gong)能(neng)于一體。產品(pin)更(geng)(geng)大輸(shu)(shu)出電(dian)(dian)(dian)壓(ya)達300V,更(geng)(geng)小測(ce)試電(dian)(dian)(dian)流(liu)(liu)量(liang)(liang)程(cheng)低(di)至(zhi)100pA,支持四(si)象限工作(zuo),因此,可(ke)(ke)廣(guang)泛應用于LDO類芯片測(ce)試。


二、常用電性能參數測試


LDO常用(yong)的電性能參數(shu)測(ce)試,主(zhu)要包(bao)括輸(shu)出電壓、輸(shu)入(ru)輸(shu)出電壓差、線(xian)性調整(zheng)率、負(fu)載調整(zheng)率、靜態(tai)電流等。由于LDO的測(ce)試需要分別采集輸(shu)入(ru)與輸(shu)出端(duan)的數(shu)據,因此一般情況下(xia),測(ce)試系統(tong)至(zhi)少需要配置2臺SMU,并采用(yong)上位機軟件(PssSMUTools)進行控制。(以下(xia)測(ce)試均參考(kao)UTC7805規格進行)

20220415163336_3318.png

                                                                           (二線法連接示意圖)


20220415163356_0183.png

                                                                           (四線(xian)法連(lian)接示(shi)意(yi)圖)


三、測試方案


? Vo輸出電壓測試


Vo輸(shu)出(chu)電(dian)(dian)壓(ya)(ya),是(shi)LDO在正常(chang)工作下的(de)穩定(ding)輸(shu)出(chu)電(dian)(dian)壓(ya)(ya)值。當加載在LDO輸(shu)入端(duan)(duan)的(de)工作電(dian)(dian)壓(ya)(ya),在規定(ding)范(fan)圍內變動時,LDO的(de)輸(shu)出(chu)電(dian)(dian)壓(ya)(ya)Vo穩定(ding)在特定(ding)范(fan)圍內。常(chang)用測(ce)試方(fang)法(fa)為,在LDO的(de)輸(shu)入端(duan)(duan),加載穩定(ding)變化的(de)電(dian)(dian)壓(ya)(ya),同時測(ce)量對應的(de)輸(shu)出(chu)端(duan)(duan)電(dian)(dian)壓(ya)(ya)值。一般采用二線(xian)法(fa)連接即可。(參考UTC7805規格書,其(qi)規格參數5V左右)


操作步驟

20220415164800_0149.png


? Voi輸入輸出電壓差,ΔVo線性調整率測試


Voi輸(shu)(shu)(shu)入輸(shu)(shu)(shu)出(chu)電(dian)(dian)(dian)(dian)壓(ya)(ya)差,是(shi)LDO正(zheng)常工作時輸(shu)(shu)(shu)入端(duan)與輸(shu)(shu)(shu)出(chu)端(duan)的更小電(dian)(dian)(dian)(dian)壓(ya)(ya)差值(zhi)。ΔVo線性調(diao)整(zheng)率(lv)是(shi)輸(shu)(shu)(shu)入電(dian)(dian)(dian)(dian)壓(ya)(ya)變(bian)(bian)化后對輸(shu)(shu)(shu)出(chu)電(dian)(dian)(dian)(dian)壓(ya)(ya)造成的影(ying)響。常用(yong)(yong)測(ce)(ce)試(shi)方法為(wei)(wei),在LDO的輸(shu)(shu)(shu)入端(duan),加(jia)載(zai)穩定變(bian)(bian)化的電(dian)(dian)(dian)(dian)壓(ya)(ya),同時測(ce)(ce)量對應的輸(shu)(shu)(shu)出(chu)端(duan)電(dian)(dian)(dian)(dian)壓(ya)(ya)值(zhi),并計算(suan)兩端(duan)電(dian)(dian)(dian)(dian)壓(ya)(ya)測(ce)(ce)差值(zhi),或者輸(shu)(shu)(shu)出(chu)端(duan)的變(bian)(bian)化值(zhi)。此外,為(wei)(wei)降低測(ce)(ce)試(shi)中線材的干擾(rao),輸(shu)(shu)(shu)入輸(shu)(shu)(shu)出(chu)電(dian)(dian)(dian)(dian)壓(ya)(ya)差測(ce)(ce)試(shi)可采用(yong)(yong)4線連(lian)接法進行測(ce)(ce)量。(參(can)考UTC7805規格書(shu),Voi值(zhi)為(wei)(wei)2V左(zuo)右,ΔVo值(zhi)為(wei)(wei)4mV左(zuo)右)


操作步驟

20220415164940_4659.png


? ΔVoload負載(zai)調整率(lv)測試


ΔVoload負載(zai)調整率是輸(shu)(shu)(shu)出(chu)端(duan)接(jie)不(bu)同(tong)負載(zai),輸(shu)(shu)(shu)出(chu)端(duan)電(dian)壓的(de)變化(hua)。由(you)于源表可以直接(jie)當電(dian)子負載(zai),所以可以直接(jie)讓源表做負載(zai)。常用測(ce)試(shi)方法(fa)為,保持LDO輸(shu)(shu)(shu)入端(duan)電(dian)壓穩定不(bu)變,在LDO的(de)輸(shu)(shu)(shu)出(chu)端(duan),加載(zai)不(bu)同(tong)的(de)電(dian)流值(zhi),同(tong)時測(ce)量(liang)(liang)對應的(de)輸(shu)(shu)(shu)出(chu)端(duan)電(dian)壓值(zhi),并計(ji)算輸(shu)(shu)(shu)出(chu)端(duan)的(de)電(dian)壓變化(hua)值(zhi)。此外,為降低測(ce)試(shi)中線材的(de)干擾(rao),該測(ce)試(shi)可采用4線連接(jie)法(fa)進行測(ce)量(liang)(liang)。(參考(kao)UTC7805規格書,ΔVoload值(zhi)為4mV左右(you))


操作步驟

20220415165037_1443.png


? IQ靜態電(dian)流測(ce)試(shi)測(ce)試(shi)


IQ靜態電(dian)(dian)(dian)流(liu),是指輸出端(duan)(duan)空載時,輸入(ru)端(duan)(duan)流(liu)進(jin)的電(dian)(dian)(dian)流(liu)。常用測(ce)試方法為,斷開LDO的輸出端(duan)(duan)的連接,加載不同的電(dian)(dian)(dian)流(liu)值(zhi),在LDO輸入(ru)端(duan)(duan)加載電(dian)(dian)(dian)壓,并測(ce)量對應的輸入(ru)端(duan)(duan)電(dian)(dian)(dian)流(liu)值(zhi)。(參考(kao)UTC7805規格(ge)書,IQ值(zhi)為5mA左右(you))

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